Beilstein J. Nanotechnol.2022,13, 610–619, doi:10.3762/bjnano.13.53
interaction force, the measurement observables, and the probe excitation parameters is defined by an average of the normal force along the samplingpath over the oscillation cycle. Usually, it is tacitly assumed that tip oscillation and force data recording follows the same path perpendicular to the surface
. Experimentally, however, the samplingpath representing the tip oscillating trajectory is often inclined with respect to the surface normal and the data recording path. Here, we extend the mathematical description of dynamic AFM to include the case of an inclined samplingpath. We find that the inclination of
measuring a heterogeneous atomic surface. We propose to measure the AFM observables along a path parallel to the oscillation direction in order to reliably recover the force along this direction.
Keywords: atomic force microscopy; cantilever; quantitative force measurement; samplingpath; Introduction
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Figure 1:
Coordinates describing the one-dimensional tip positioning and movement. See main text for descript...